Authors:
Benjamin Schoch | Institute of Robust Power Semiconductor Systems, University of Stuttgart | Germany
Florian Wiewel | Institute of Robust Power Semiconductor Systems, University of Stuttgart | Germany
Dominik Wrana | Institute of Robust Power Semiconductor Systems, University of Stuttgart | Germany
Laura Manoliu | Institute of Robust Power Semiconductor Systems, University of Stuttgart | Germany
Simon Haussmann | Institute of Robust Power Semiconductor Systems, University of Stuttgart | Germany
Dr. Axel Tessmann | Fraunhofer IAF, Fraunhofer Institute for Applied Solid State Physics | Germany
Prof. Ingmar Kallfass | Institute of Robust Power Semiconductor Systems, University of Stuttgart | Germany